photoelectron spectrometer

См. также в других словарях:

• X-ray photoelectron spectroscopy — [ right|thumb|350px|Basic components of a monochromatic XPS system.] X ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state… …   Wikipedia

• X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq …   Wikipédia en Français

• Electron spectrometer — In an Electron spectrometer, an incoming beam of electrons is bent with electric or magnetic fields. As higher energy electrons will be bent less by the beam, this produces a spatially distributed range of energies. Electron spectrometers are… …   Wikipedia

• David W. Turner — David Warren Turner (1927 ) is a physical chemist known for the development of ultra violet photoelectron spectroscopy (UPS), a technique for the measurement of molecular orbital energies in gas phase molecules. His first paper on photoelectron… …   Wikipedia

• spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… …   Universalium

• surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium

• Polar wind — is the permanent outflow of ionization from the polar regions of the magnetosphere. [http://amsglossary.allenpress.com/glossary/browse?s=p p=43 AMS Glossary] ] Ionospheric Plasma SourceThe ‘ground state’ of the ionosphere consists of the baseline …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq …   Wikipédia en Français

• Spectrometrie de fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq …   Wikipédia en Français

• Spectrométrie de fluorescence X — Pour les articles homonymes, voir SFX, FX et XRF. Un chimiste manipule un goniomètre manuel pour l analyse par spectrométrie de fluorescence X de monocristaux d échant …   Wikipédia en Français